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Kumar, Nitish

1crack growth 1electrodes 1fatigue 1fracture mechanics/toughness 1fracture properties 1ion migration 1relaxors 1surface layer

1Jones, Jacob L.

Date

12020 12021

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1crack growth 1electrodes 1fatigue 1fracture mechanics/toughness 1fracture properties 1ion migration 1relaxors 1surface layer

1Jones, Jacob L.

Date

12020 12021

Title
Creator
Date

Fracture and electric-field-induced crack growth behavior in NBT-6BT relaxor ferroelectrics

- Shi, Xi, Kumar, Nitish, Jones, Jacob L., Hoffman, Mark

Creator: Shi, Xi , Kumar, Nitish , Jones, Jacob L. , Hoffman, Mark
Resource Type: journal article
Date: 2021

Electrical fatigue in 0.94Na0.5Bi0.5TiO3-0.06BaTiO3: influence of the surface layer

- Shi, Xi, Kumar, Nitish, Hoffman, Mark

Creator: Shi, Xi , Kumar, Nitish , Hoffman, Mark
Resource Type: journal article
Date: 2020

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